Charged

đź“’Charged by Carol Moreira

Book Title : Charged
Author : Carol Moreira
Publisher : James Lorimer & Company
Release Date : 2008-05-15
Pages : 128
ISBN : 9781552770085
Available Language : English, Spanish, And French

Charged Summary : Craig and Manda see only flaws in their parents.

Book Title : The Finite Element Method in Charged Particle Optics
Author : Anjam Khursheed
Publisher : Springer Science & Business Media
Release Date : 2012-12-06
Pages : 274
ISBN : 9781461552017
Available Language : English, Spanish, And French

The Finite Element Method in Charged Particle Optics Summary : In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.

Book Title : Proton and Charged Particle Radiotherapy
Author : Thomas F. De Laney
Publisher : Lippincott Williams & Wilkins
Release Date : 2008
Pages : 274
ISBN : 0781765528
Available Language : English, Spanish, And French

Proton and Charged Particle Radiotherapy Summary : This volume is the first comprehensive and practical clinical reference on proton and charged particle radiotherapy. The first half of the book explains the treatment delivery systems used, offers detailed guidance on treatment planning techniques, examines key clinical issues in proton radiotherapy, and reviews recent experience with heavier charged particle radiotherapy. The second half of the book offers "how-to" information on treatment of pediatric tumors, lymphomas, and tumors of the central nervous system, eye, skull base, cervical spine, bone and soft tissue, paranasal sinus, nasal cavity, nasopharynx, oropharynx, oral cavity, salivary glands, prostate, lung, gastrointestinal tract, female reproductive tract, and breast. More than 100 full-color illustrations complement the text.

Book Title : Charged Particle Traps II
Author : GĂĽnther Werth
Publisher : Springer Science & Business Media
Release Date : 2009-09-16
Pages : 276
ISBN : 9783540922612
Available Language : English, Spanish, And French

Charged Particle Traps II Summary : This second volume of the Charged Particle Traps deals with the rapidly expanding body of research exploiting the electromagnetic con?nement of ions, whose principles and techniques were the subject of volume I. These applications include revolutionary advances in diverse ?elds, ranging from such practical ?elds as mass spectrometry, to the establishment of an ult- stable standard of frequency and the emergent ?eld of quantum computing made possible by the observation of the quantum behavior of laser-cooled con?nedions. Bothexperimentalandtheoreticalactivity intheseapplications has proliferated widely, and the number of diverse articles in the literature on its many facets has reached the point where it is useful to distill and organize the published work in a uni?ed volume that de?nes the current status of the ?eld. As explained in volume I, the technique of con?ning charged particles in suitable electromagnetic ?elds was initially conceived by W. Paul as a thr- dimensional version of his rf quadrupole mass ?lter. Its ?rst application to rf spectroscopy on atomic ions was completed in H. G. Dehmelt’s laboratory where notable work was later done on the free electron using the Penning trap. The further exploitation of these devices has followed more or less - dependently along the two initial broad areas: mass spectrometry and high resolution spectroscopy. In volume I a detailed account is given of the theory of operation and experimental techniques of the various forms of Paul and Penning ion traps.

Book Title : Charged Particle and Photon Interactions with Matter
Author : A. Mozumder
Publisher : CRC Press
Release Date : 2003-11-14
Pages : 860
ISBN : 0203913280
Available Language : English, Spanish, And French

Charged Particle and Photon Interactions with Matter Summary : Charged Particle and Photon Interactions with Matter offers in-depth perspectives on phenomena of ionization and excitation induced by charged particle and photon interactions with matter in vivo and in vitro. This reference probes concepts not only in radiation and photochemistry, but also in radiation physics, radiation biochemistry, and radiation biology as well as recent applications in medicine and material, environmental, space, and biological science and engineering. It studies reports on the interactions of high-energy photons, specifically in the vacuum ultraviolet-soft X-ray region to offer fundamental information on the primary processes of the interactions of charged particles with matter.

Book Title : Handbook of Charged Particle Optics Second Edition
Author : Jon Orloff
Publisher : CRC Press
Release Date : 2008-10-24
Pages : 666
ISBN : 1420045555
Available Language : English, Spanish, And French

Handbook of Charged Particle Optics Second Edition Summary : With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Book Title : Atomic Molecular and Optical Physics Charged Particles
Author :
Publisher : Academic Press
Release Date : 1995-11-29
Pages : 463
ISBN : 0080860176
Available Language : English, Spanish, And French

Atomic Molecular and Optical Physics Charged Particles Summary : With this volume, Methods of Experimental Physics becomes Experimental Methods in the Physical Sciences, a name change which reflects the evolution of todays science. This volume is the first of three which will provide a comprehensive treatment of the key experimental methods of atomic, molecular, and optical physics; the three volumes as a set will form an excellent experimental handbook for the field. The wide availability of tunable lasers in the pastseveral years has revolutionized the field and lead to the introduction of many new experimental methods that are covered in these volumes. Traditional methods are also included to ensure that the volumes will be a complete reference source for the field.

Book Title : Trapping Highly Charged Ions
Author : John Gillaspy
Publisher : Nova Publishers
Release Date : 2001
Pages : 481
ISBN : 156072725X
Available Language : English, Spanish, And French

Trapping Highly Charged Ions Summary : This book provides and elementary introduction to the field of trapping highly charged ions. The first group of chapters is intended to describe the various sorts of highly charged ion traps: EBIT, EBIS, ECR, Storage Rings and various speciality traps. The authors focus on their own ion trap facilities in order to teach by example. The chapters range in scope from comprehensive reviews to brief introductions. The second group of chapters is intended to give a flavour of the various sorts of scientific research which are presently being carried out with traps for highly charged ions. These chapters not only inform, but also stimulate newcomers to think up fresh ideas. The articles in this second group generally fall into one of three broad categories: atomic structure experiments, ion-surface interactions and precision mass spectrometry. The third group of chapters is intended to deal with theory and spectroscopic analysis. It provides some of the background material necessary to make sense of observed phenomenology, to allow detailed explanation of experimental data, and to sensibly plan further experimentation. An appendix provides a complete keyword-annotated bibliography of pa

Book Title : Penetration of Charged Particles in Matter
Author :
Publisher : National Academies
Release Date : 1970
Pages : 72
ISBN : NAP:12675
Available Language : English, Spanish, And French

Penetration of Charged Particles in Matter Summary :

Book Title : Charged Semiconductor Defects
Author : Edmund G. Seebauer
Publisher : Springer Science & Business Media
Release Date : 2008-11-14
Pages : 298
ISBN : 9781848820593
Available Language : English, Spanish, And French

Charged Semiconductor Defects Summary : Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of “defect engineering”. For example, in the bulk, charging significantly affects the total concentration of defects that are available to mediate phenomena such as solid-state diffusion. Surface defects play an important role in mediating surface mass transport during high temperature processing steps such as epitaxial film deposition, diffusional smoothing in reflow, and nanostructure formation in memory device fabrication. “Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors. Features: group IV, III-V, and oxide semiconductors; intrinsic and extrinsic defects; and, point defects, as well as defect pairs, complexes and clusters.